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Intellectual System of Conducted EMI Noise and its Parameter-Modeling(PDF)

南京师范大学学报（工程技术版）[ISSN:1006-6977/CN:61-1281/TN]

Issue:
2006年04期
Page:
11-16
Research Field:
Publishing date:

Info

Title:
Intellectual System of Conducted EMI Noise and its Parameter-Modeling
Author(s):
SHEN Xuemei; ZHAO Yang; LI Shijin; YIN Haiping
School of Electrical and Automation Engineering,Nanjing Normal University,Nanjing 210042,China
Keywords:
electrom agne tic inter ference ( EM I);  no ise diagnosis;  no ise suppression;  param eter-modeling
PACS:
TP273;TN03
DOI:
-
Abstract:
As mo st prob lem s o f the conduc ted EM I no ise is not so lv ed so per fec tly, the paper presents an inte llectua l system o f conducted no ise diagnosis and suppression. The sy stem is consisted of so ftware and hardw are, a im s to dea-l ing w ith the no ise properly. Resea rch on param eter-m ode ling o f the inte llectua l system is done. It presen ts a m athem atical model and design gu idance both techn ica lly and econom ica lly. The paper also g ives the test setup and an exam ple. The experim ental resu lts show tha t this intellectua l system is e ffic ient in so lv ing e lectrom agnetic no ise on the power line.

References:

[ 1] 赵阳, 李世锦, 孟照娟, 等. 传导性EM I噪声的模态分离与噪声抑制技术探讨[ J]. 南京师范大学学报: 工程技术版, 2004, 4( 4) : 1-4.
ZHAO Yang, LI Shijin, MENG Zhao juan, et a .l Techn ique of conducted EM I no ise separation and no ise suppression [ J]. Jou rnal of Nanjing Norm al University: ENG INEERING AND TECHNOLOGY ED ITION, 2004, 4( 4): 1-4. ( in Ch inese)
[ 2] PAUL C R, HARDIN K B. D iagnosis and reduction o f conducted no ise em ission [ J]. IEEE Trans EM C, 1988, 30( 4) : 553- 560.
[ 3] SEE K Y. Netw ork fo r conducted EM I d iagnos is [ J]. E lectronics Le tters, 1999, 35( 17): 1 446-1 447.
[ 4 ] MARDIGU IAN M, RAIM BOURG J. An a lterna tive m ethod for characterizing EM I filte r [ J] . Pro c of IEEE on EMC, 1999( 2): 882-886.
[ 5] GUO TING, CHEN D Y, LEE F C. Separation o f the comm on-mode-and differentia-lm ode- conducted EM I no ise [ J]. IEEE T rans on Pow er E lec tron ics, 1996, 11( 3) : 480-488.
[ 6] SEE K Y, YANG L. M easurement of no ise source impedance o f SMPS using two current probes[ J]. E lectron ics Letters, 2000, 36( 21): 1 774-1 776.

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Last Update: 2013-04-29