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南京师范大学学报（工程技术版）[ISSN:1006-6977/CN:61-1281/TN]

Issue:

2006年04期

Page:

71-74

Research Field:

Publishing date:

Info

Title:

Experimental Analysis and Calculation of Electron Diffraction Cameral Length in TEM

Author(s):

WANG Xinghe; ZHOU Yanhuai

School of Physical Science and Technology,Nanjing Normal University,Nanjing 210097,China

Keywords:

TEM;  e lectron diffraction;  cam era l leng th;  cam era l consten t

PACS:

O463.1

DOI:

-

Abstract:

The cam era length of electron diffraction in transm isson electron m icroscopy ( TEM ) is one of the m a in techn ica l param eters in designing e lectron m icroscope and the electron diffrac tion ana ly sis tom icrocry sta l sam ple. A cco rd ing to B ragg law, the fo rmu la o f ca lculating TEM electron diffrac tion cam era leng th is derived from the research on the ray pa th of electron diffraction im ages in TEM and the com par ison on electron diffraction w ith o rd ina ry e lectronic diffractom ete r. The difference of physical sign ificance o f e lectron d iffraction cam era leng th be tw een TEM and ord-i nary e lectronic diffractom eter is d iscussed. The reso lution index of e lec tron d iffraction in TEM is analyzed. The exac-t ly exper im enta lm e thod is g iven fo r dem arcating e lectron d iffraction came ra length by Go ld-m ono crysta l in TEM.

References:

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[ 2] 邵健中. 电子离子光学仪器原理[M ]. 杭州: 浙江大学出版社, 1988.
SHAO Jianzhong. Princ ip les of E lectron and Ion Optica l Instrum en t[M ]. H angzhou: Zhe jiangUn iv ers ity Press, 1988. ( in Chi nese)
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Memo

Memo:

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Common functions

Last Update: 2013-04-29