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Test Setup Design for Conducted EMI Noise Measurement(PDF)

南京师范大学学报（工程技术版）[ISSN:1006-6977/CN:61-1281/TN]

Issue:
2008年02期
Page:
19-22
Research Field:
Publishing date:

Info

Title:
Test Setup Design for Conducted EMI Noise Measurement
Author(s):
Sun Yan; Zhao Yang; Li Shijin; Jiang Ningqiu; Yin Haiping
School of Electrical and Automation Engineering,Nanjing Normal University,Nanjing 210042,China
Keywords:
conducted EM I;  comm on-m ode /d ifferentia-lm ode no ise;  ground line;  test se tup
PACS:
TN97
DOI:
-
Abstract:
A ccurate d iagnos is o f conduc ted electrom agne tic interference ( EM I) no ise is an important basis of so lv ing the pow er e lec tron ic products e lectrom agnetic interference prob lem. This paper introduces the standard testing env ironm ent o f elctro-m agnetica lly inter fering the elctro-m agnetic compatib le EM C conductiv ity, proposes draw ing out the ground line to ob tain a rea l “ s ing le-phase three- line” system, so lv es the prob lem o f no ise s igna l lack ing of comm on-m ode no ise in the m easurem ent o f trad itiona l labs, and estab lishes test setup in acco rdancew ith the no rm. The paper also describes the pr inciple of test setup design and the concrete design process. The expe rim ent proves tha t this test setup w ith the design o f ground line effective ly guarantees common m ode ( CM ) / diffe rentia lm ode ( DM ) no isem easurement, and that the resu lts are ve ry good.

References:

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Last Update: 2013-04-24