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Summary of EMC Technology in Design of Power Chip in China(PDF)

南京师范大学学报(工程技术版)[ISSN:1006-6977/CN:61-1281/TN]

Issue:
2019年04期
Page:
1-7
Research Field:
2019全国集成电路可靠性学术会议专栏
Publishing date:

Info

Title:
Summary of EMC Technology in Design of Power Chip in China
Author(s):
Liu YaodongSun RanJiang WenchaoLiu XuanZhang Yun
Jiangsu Productivity Promotion Center,Nanjing 210042,China
Keywords:
power chipelectromagnetic interferenceEMCtesting technique
PACS:
TN401
DOI:
10.3969/j.issn.1672-1292.2019.04.001
Abstract:
This paper mainly studies the development status and trend of power chip at home and abroad,and analyzes the main problems in the EMC design of power chip in China. Based on the theory of EMC,the test methods and protection measures of electromagnetic immunity and electromagnetic interference of power chip are studied. This paper focuses on three design methods to reduce the influence of EMC in the design stage of power chip. Finally,the challenges and development of EMC standards for power chips are introduced.

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Last Update: 2019-12-31