参考文献/References:
[ 1] Chen H ao, Su Tao. Contro l of the sw itched re luctancem otor drive at four quadrants based on inte l 87C196KC s ing le ch ip m i croprocessor[ J]. Dynam ics of Continuous, Disc rete and Impulsive System s: Ser ies B, 2005( Supplem ent): 306- 311.
[ 2] Chen H ao, Zan X iaoshu. Contro l of the double sw itched re luctance var iable speed w ind pow er genera tors para llel system [ J]. Dynam ics of Continuous, Disc rete and Impulsive System s: Ser ies B, 2005( Supplem ent): 301- 305.
[ 3] Zhao Y ang, SeeKye Yak. Per fo rm ance study o f CM /DM d iscrim ination netw ork for conducted EM I diagnosis[ J]. Ch inese Jou rnal of E lectron ic, 2003, 12( 4): 205- 208.
[ 4] Paul C R, H ard in K B. D iagnos is and reduction o f conduc ted no ise em ission[ J]. IEEE Trans on E lec trom agnetic Com pa tibili ty, 1988, 33( 4): 195- 203.
[ 5] See K Y. Ne tw ork fo r conducted EM I d iagno sis[ J]. E lectron ic Letter, 1999, 35( 17): 1 446- 1 447.
[ 6] M a rd iguianM, Rainbourg J. An a lternative, comp lementarym e thod for character iz ing EM I filter[ J] . IEEE Int Sym on EMC, 1999( 2): 882- 886.
[ 7] Guo T, Chen D Y. Separa tion o f the common-m ode and d ifferential-mode conducted EM I no ise[ J]. IEEE Trans Pow er E lec- tron ics, 1996, 11( 3): 259- 263.
[ 8] Lo Y K. A so ftw are-based CM and DM m easurem en t system for conduc ted EM I[ J]. IEEE Trans on Industrial E lec tron ics, 2000, 47( 4): 253- 255.
[ 9] FredericM Tesche. On the use o f H ilbert transform fo r processing m easured CW data [ J]. IEEE Trans on E lectrom agne tic Com pa tibility, 1992, 34( 3): 310- 314.