[1]王兴和,周延怀.TEM中电子衍射相机长度的实验分析及计算[J].南京师范大学学报(工程技术版),2006,06(04):071-74.
　WANG Xinghe,ZHOU Yanhuai.Experimental Analysis and Calculation of Electron Diffraction Cameral Length in TEM[J].Journal of Nanjing Normal University(Engineering and Technology),2006,06(04):071-74.
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TEM中电子衍射相机长度的实验分析及计算
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南京师范大学学报（工程技术版）[ISSN:1006-6977/CN:61-1281/TN]

卷:
06卷
期数:
2006年04期
页码:
071-74
栏目:
出版日期:
2006-12-30

文章信息/Info

Title:
Experimental Analysis and Calculation of Electron Diffraction Cameral Length in TEM
作者:
王兴和;周延怀;
南京师范大学物理科学与技术学院, 江苏南京210097
Author(s):
WANG Xinghe; ZHOU Yanhuai
School of Physical Science and Technology,Nanjing Normal University,Nanjing 210097,China
关键词:
透射式电子显微镜;  电子衍射;  相机长度;  相机常数
Keywords:
TEM;  e lectron diffraction;  cam era l leng th;  cam era l consten t
分类号:
O463.1
摘要:
透射式电子显微镜(Transm isson E lectron M icroscopy,TEM)中的电子衍射相机长度,是电子显微镜设计和对微晶体样品进行电子衍射分析的主要技术参数之一.依据布拉格(B ragg)定律,经对TEM中电子衍射成像光路的探讨与研究,并通过TEM与普通电子衍射仪的电子衍射的对比分析,导出了TEM电子衍射相机长度的精确计算公式,阐述了TEM和普通电子衍射仪的电子衍射相机长度所表征的物理意义的区别.同时对TEM中的电子衍射分辨率指数进行了分析和讨论,并给出了实际应用金单晶标样精确标定TEM电子衍射相机长度的实验方法.
Abstract:
The cam era length of electron diffraction in transm isson electron m icroscopy ( TEM ) is one of the m a in techn ica l param eters in designing e lectron m icroscope and the electron diffrac tion ana ly sis tom icrocry sta l sam ple. A cco rd ing to B ragg law, the fo rmu la o f ca lculating TEM electron diffrac tion cam era leng th is derived from the research on the ray pa th of electron diffraction im ages in TEM and the com par ison on electron diffraction w ith o rd ina ry e lectronic diffractom ete r. The difference of physical sign ificance o f e lectron d iffraction cam era leng th be tw een TEM and ord-i nary e lectronic diffractom eter is d iscussed. The reso lution index of e lec tron d iffraction in TEM is analyzed. The exac-t ly exper im enta lm e thod is g iven fo r dem arcating e lectron d iffraction came ra length by Go ld-m ono crysta l in TEM.

参考文献/References:

[ 1] 朱宜, 张存圭. 电子显微镜的原理和使用[M ]. 北京: 北京大学出版社, 1983.
ZHU Y ,i ZHANG Cungu.i Princ ip les & App lication of E lec tronM icroscopy[M ]. Be ijing: Pek ing Univers ity Press, 1983. ( in Chinese)
[ 2] 邵健中. 电子离子光学仪器原理[M ]. 杭州: 浙江大学出版社, 1988.
SHAO Jianzhong. Princ ip les of E lectron and Ion Optica l Instrum en t[M ]. H angzhou: Zhe jiangUn iv ers ity Press, 1988. ( in Chi nese)
[ 3] 洪班德, 崔约贤. 材料电子显微分析实验技术[M ]. 哈尔滨: 哈尔滨工业大学出版社, 1990.
HONG Bande, CU IYuex ian. E lec tronM icroscopy Techn ique ofM ater ia ls[M ]. H arbin: H arbin Institute o f Techno logy Press, 1990. ( in Chinese)

备注/Memo

备注/Memo:
作者简介: 王兴和( 1957-) , 高级工程师, 主要从事物理电子学的教学与研究. E-m ail:w angxingh e@ n jnu. edu. cn
更新日期/Last Update: 2013-04-29