[1]赵阳,等.电子设备静电放电抗扰度性能优化研究[J].南京师范大学学报(工程技术版),2011,11(02):001-3.
　Zhao Yang,Chu Pengchao,et al.Research on the ESD Immunity Performance of a Weighing Controller[J].Journal of Nanjing Normal University(Engineering and Technology),2011,11(02):001-3.
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电子设备静电放电抗扰度性能优化研究
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南京师范大学学报（工程技术版）[ISSN:1006-6977/CN:61-1281/TN]

卷:
11卷
期数:
2011年02期
页码:
001-3
栏目:
出版日期:
2011-04-09

文章信息/Info

Title:
Research on the ESD Immunity Performance of a Weighing Controller
作者:
赵阳1; 2; 褚鹏超1; 朱志毅1
( 1． 南京师范大学电气与自动化工程学院，江苏南京210042; 2． 苏州泰斯特电子科技有限公司，江苏苏州215011)
Author(s):
Zhao Yang1; 2; Chu Pengchao1; Zhu Zhiyi1
1.School of Electrical and Automation Engineering,Nanjing Normal University,Nanjing 210042,China2.Suzhou 3CTest Company,Suzhou 215011,China
关键词:
静电放电; 称重控制器; 结构; 抗扰度
Keywords:
electrostatic discharge; weighing controller; structure; immunity
分类号:
TN03
摘要:
静电放电(ESD)抗扰度性能已成为衡量电子产品性能的一项重要指标.针对某一型号的称重控制器提出了一种用于提高该被测设备静电放电抗扰度性能的新方法.针对称重控制器的结构,分析其因不良的架构导致静电放电的原因,通过铜带线改良其连接,使其成为一个紧密整体,并分别对于液晶显示部分和内壳结构进行改进.实验结果表明被测物体可顺利通过测试,证明了该方法的有效性.
Abstract:
Electrostatic Discharge ( ESD) immunity test is a test of required electromagnetic interference ( EMS) project of many electronic products． The weighing controller failed to pass the test，and it is too complicated to modify the circuit with large-scale． This paper presents a new idea of electrostatic discharge improvement． By analyzing its structure， it is deduced that electrostatic discharge due to the poor structure，improves the structure of EUT by using flat type copper wire，then improves the liquid crystal display part and the inner shell structure respectively． The test result shows that the equipment succeeded in passing the test，which proved that the method is effective，and it offers some reference value when some circuits are too complex to modify．

参考文献/References:

［1］樊明龙，倪永宏． 静电及其防护［J］． 微电子技术， 2002， 30( 6) : 19-21． Fan Minglong，Ni Yonghong． Static electricity and its protect［J］． Microelectronic Technology， 2002， 30( 6) : 19-21． ( in Chinese)
［2］中国国家标准化管理委员会． GB/T 17626. 2 － 2006，电磁兼容试验和测量技术静电放电抗扰度试验［S］． 北京: 中国标准出版社， 2006． Committee for Standardization in China． GB/T 17626. 2 － 2006，Electromagnetic compatibility-Testing and measurement techniques- Electrostatic discharge immunity test［S］． Beijing: Standards Press of China， 2006． ( in Chinese)
［3］王卫民，孙宇华． ESD 破坏的特点及对策［J］． 电测与仪表， 2003，5 ( 6) : 24-26( 38) ． Wang Weimin，Sun Yuhua． The character of damage caused by the ESD and the protective project［J］Electrical Measurement and Instrumentation， 2003，5 ( 6) : 24-26( 38) ． ( in Chinese)
［4］孙国至，刘尚合，安霆． 某电子系统的ESD 抗扰度性能研究［J］． 中国电子科学研究院学报， 2008，4 ( 3) : 351-354． Sun Guozhi，Liu Shanghe，An Ting． Research on the ESD immunity performance of an electronic system［J］． Journal of China Academy of Electronics and Information Technology， 2008，3 ( 4) : 351-354． ( in Chinese)
［5］ESD Association Standard STM5． 1 － 1998，For electrostatic discharge sensitivity testing － Human Body Model ( HBM) —component level［S］． ESD Association， 2001． American national standard， 2007.

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备注/Memo

备注/Memo:
基金项目: 江苏省自然科学基金( BK2008429) 、毫米波国家重点实验室开放基金( K201106) 、南京师范大学研究生优秀论文培育计划 ( 2010ss0018) ．通讯联系人: 赵阳，教授，博士生导师，研究方向: 电磁兼容． E-mail: zhaoyang2@ njnu． edu． Cn
更新日期/Last Update: 2013-03-21