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An Intellectual Electromagnetic Interference Measurement System on Power-line with Noise Diagnosis and Mitigation(PDF)

南京师范大学学报（工程技术版）[ISSN:1006-6977/CN:61-1281/TN]

Issue:
2005年02期
Page:
5-9
Research Field:
Publishing date:

Info

Title:
An Intellectual Electromagnetic Interference Measurement System on Power-line with Noise Diagnosis and Mitigation
Author(s):
LI Shijin1; ZHAO Yang 1; 2; SHEN Xuemei1; CHEN Hao2
1.School of Electrical and Automation Engineering, Nanjing Normal University, Jiangsu Nanjing 210042, China; 2.School of Information and Electrical Engineering, China University of Mining and Technology, Jiangsu Xuzhou 221008, China; 3.State Key Lab of Millimeters Waves,Southeast University, Jiangsu Nanjing 210096,China
Keywords:
conductiv e e lectrom agnetic interference;  no ise d iagno sis;  no ise m itigation;  no ise separation;  e lectrom agnetic com pa tibility( EMC);  inte llectual system
PACS:
TM764
DOI:
-
Abstract:
As the diagnosis and suppression techn iques o f conducted EM I noise are no t so pe rfect, there are still m any prob lem s, especia lly the inte llectua l so lution schem es prov iding form any e lectric& electronic produc tm anufacture rs. The paper presents an inte llectualm easurem ent sy stem inc luding no isem ode-decomposition w ith hardw are and no ise diagnosis w ith so ftw are, proposes a new idea o f genera lizing and unify ing filte r designing schem e, and g ives the test setup and an ex amp le to show that th is intellec tua l system is effic ient in solv ing e lectrom agnetic no ise on the power- line.

References:

[ 1] Paul C R, H ard in K B. D iagnos is and reduction o f conducted no ise em ission[ J]. IEEE T rans on E lectrom agne-t ic Compatib ility, 1988, 33( 4): 553-560.
[ 2] Guo T, Chen D Y. Separation o f the common-m ode and d ifferentia-lm ode conducted EM I no ise [ J]. IEEE Trans Pow er E lec tron ics, 1996, 11( 3) : 480-488.
[ 3] Zhao Y, See K Y. D iagnosis Ne tw ork Pe rfo rm ance For Conducted EM IM easurem ent[ R] . Oh io: IEEE AP-S D-i gest, 2003.
[ 4] Zhao Y, SeeK Y, Li S J. No ise D iagnos is Techn iques in Conducted E lectrom agnetic Interference ( EM I) M easurem ent: M ethods Analysis and Design[ R]. CA: IEEE APS D ig est, 2004.
[ 5] LoY K, Ch iu H J, Song T H. A softw are-based CM and DM m easurem ent system fo r conducted EM I [ J]. IEEE Trans on Industr ia l E lec tron ics, 2000, 47( 4) : 977-978.
[ 6] N ave M ark J. Pow er Line F ilte r Design for Sw itched ) M ode Pow er Supplies[M ]. New York: Van Nostrand Reinho ld, 1991. 1446-1447.

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Last Update: 2013-04-29